March Algorithm

A march algorithm is a widely used method for testing static random-access memory (SRAM) by writing and reading test patterns across every memory cell in a sequence of passes called march elements, scanning the memory upward, downward or in both directions and performing specified read and write operations at each address. Multiple march elements are combined into a full test sequence, described with a standard notation in which arrows indicate the scan direction and symbols such as w0, w1, r0 and r1 denote writing or reading a 0 or 1 at each cell. March algorithms are designed to detect a range of characteristic SRAM faults, including stuck-at faults, transition faults, address decoder faults, and several kinds of coupling faults between cells, including inversion, idempotent and state coupling faults. This description is adapted from Wikipedia contributors under CC BY-SA 4.0; changes were made. https://creativecommons.org/licenses/by-sa/4.0/