Edward B. Eichelberger

Edward B. Eichelberger (born February 8, 1934, in Norfolk, Virginia) is an American engineer who spent his career at IBM from 1956 to 1994 working on chip design, circuit design and test automation. He developed the level-sensitive scan design (LSSD) technique for testing solid-state logic circuits, work recognized with an IBM Outstanding Contribution Award in 1973, and shared the IEEE Computer Society W. Wallace McDowell Award in 1989 with Thomas W. Williams for developing the scan technique and for leading and promoting design-for-testability concepts, which became standard practice across the semiconductor industry. He was named an IBM Fellow and an IEEE Fellow in 1986.