Thomas W. Williams

Thomas W. Williams (born August 3, 1943) is an American engineer who managed IBM's VLSI Design for Testability group in Boulder, Colorado, before later becoming a Fellow and Chief Scientist at Synopsys. Working with Edward B. Eichelberger, he helped develop and promote the level-sensitive scan design (LSSD) technique for testing electronic circuits, for which the two shared the IEEE Computer Society W. Wallace McDowell Award in 1989. Williams was named an IEEE Fellow in 1988, later received the EDAA Lifetime Achievement Award in 2007 and the Phil Kaufman Award in 2018, and founded the IEEE Computer Society's workshop on design for testability.